Application

Electron Microscopy

Designing the electron-optical columns at the heart of SEM, TEM, and STEM instruments.

Voltrace models the full electron-optical column—from electron guns and condenser lenses to objective lenses, apertures, and stigmators. Accurate field solving combined with high-precision particle tracing lets designers predict focal properties, aberrations, and resolution long before any hardware is built.

Because the Boundary Element Method delivers smooth, high-fidelity fields along the optical axis, Voltrace is especially well suited to the demanding tolerances of high-resolution microscopy, where small field errors translate directly into lost resolution.

  • Electrostatic and magnetic lens design
  • Aberration and focal-property analysis
  • Stigmator and deflector modelling
  • High-accuracy tracing along the optical axis
Electron microscope column